16-MP CMOS image sensor targets factory automation

ON Semiconductor has expanded its XGS series of CMOS image sensors with the introduction of the XGS 16000 16-megapixel (MP) sensor, targeting factory automation applications including robotics and inspection systems. The CMOS image sensor consumes only 1 watt at 65 frames per second (fps), making it one of the best in class for power consumption, while also offering one of the highest resolutions available for standard 29 × 29 mm industrial cameras, said the company.

The XGS 16000 shares a common architecture and footprint with other XGS CMOS image sensors. This enables manufacturers to use a single camera design to develop products in different resolutions, said ON Semiconductor. The sensor supports up to 65 fps readout at full resolution, and is available in various speed grades, all with Bayer color or monochrome options.

16-MP CMOS image sensor targets factory automationThe XGS 16000 CMOS image sensor, featuring an advanced 3.2 µm global shutter pixel, is designed in a unique 1:1 square aspect ratio, which helps maximize the image capture area within the optical circle of the camera lens and ensure optimal light sensitivity, said the company. This makes the sensor compatible with 29 mm2 industry-standard camera formats using commercially available C-mount lenses.

ON Semiconductor said its global shutter pixel technology addresses the limitations associated with rolling shutter pixels such as motion blur and distortion in camera systems used in intelligent transportation systems (ITS), machine vision inspection, and industrial automation. “This is increasingly important in automation, inspection, and identification applications,” said the company.

The XGS 16000 is available in a 163-pin iLGA package in both monochrome and Bayer color configurations. Color and mono versions of the XGS 16000 X-Cube and X-Celerator developer kits are available to help simplify design. High-speed conversion to MIPI interface examples are provided with the reference design kits to allow for quicker integration into standard FPGA evaluation environments.

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